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For
questions and/or comments about the design and content of this site
send email to bch5143@comp.tamu.edu.
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| Highly-Charged Ion Interaction Beam Line | |||||||||||||||||||||||||||||||||||||
| The
Highly-Charged Ion Interactions Beam Line is designed for studies
of interactions between the beam particles and solid or gaseous targets
at the atomic level. It is equipped with a projectile charge-state
spectrometer (featuring a vertical bending magnet and a microchannel
plate position sensitive detector) and a differentially pumped gas
target system (consisting of either a gas cell or a gas jet, and a
time-of-flight spectrometer). Optionally, the projectile charge-state
spectrometer may be replaced by a high resolution curved-crystal spectrometer
(with provisions for both solid and gas targets), or by a solid state
x-ray detector [Si(Li) or PIN diode].
This beam line is currently being used to examine: (a) the dependence of target K-vacancy production cross sections on the projectile and target atomic number, (b) the effects of secondary K-shell ionization of K-vacancy production cross sections, (c) the charge state distributions of outgoing high-energy projectiles following their interaction with gas targets, (d) the beam energy dependence of projectile charge-changing cross sections. |
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| Projectile charge-state spectrometer | |||||||||||||||||||||||||||||||||||||
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| High resolution curved-crystal x-ray spectrometer | |||||||||||||||||||||||||||||||||||||
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Gas
jet system and ion-ion coincidence time-of-flight spectrometer
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| FAUST | |||||||||||||||||||||||||||||||||||||